US Patent: 2,267,332
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| Direct Reading Positive Measuring Micrometer Gauge
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Patentee:
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| Albert G. Hagstrom (exact or similar names) - West Hartford, CT |
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Patent Dates:
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| Applied: |
Dec. 09, 1940 |
| Granted: |
Dec. 23, 1941 |
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Patent Pictures:
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Joel Havens
"Vintage Machinery" entry for L. S. Starrett Co.
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Description: |
| This patent was improved by patent #2,741,847.
This patent was used on the No. 221 Starrett micrometer.
Abstract:
My invention relates to that class of instruments for effecting delicate and accurate measurements, particularly as to depth and length or other dimensions of an article, and an object of the invention, among others, is the production of an instrument of the type herein mentioned, by means of which measurements to an extremely fine degree may be attained in a most accurate and expeditious manner.
Claim:
A micrometer gauge comprising a frame and including a threaded spindle, an anvil in cooperative relation with the spindle, a barrel in which the spindle is contained, a plurality of measuring sleeves rotatably mounted upon the barrel and upon one another, a connection between said sleeves for multiplying the rate of rotation of one relatively to another, a yielding connection between one of said sleeves and said spindle for operation of the latter, and means on said barrel and sleeves for denoting the amount of movement of said sleeves.
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