US Patent: 6,519,867
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Measuring Device
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Patentee:
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Akitomo Saeki (exact or similar names) - Kure, Japan |
Manufacturer: |
Not known to have been produced |
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Patent Dates:
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Applied: |
Jul. 10, 2000 |
Granted: |
Feb. 18, 2003 |
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Joel Havens
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Description: |
Oliff & Berridge, PLC - patent attorneys
Abstract
A micrometer comprising a thimble made, at least in part, of a translucent material, a vernier scale on an inner circumference of the thimble along the circumferential direction and a vernier numeral on an outer circumference of the thimble along the circumferential direction, whereby reading error during measurement can be reduced.
Application filed in Japan, 13 Jul 1999. |
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