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US Patent: 6,519,867
Measuring Device
Patentee:
Akitomo Saeki (exact or similar names) - Kure, Japan

USPTO Classifications:
33/679.1, 33/813, 33/830, 33/831

Tool Categories:
layout tools : measurement gauges

Assignees:
Mitutoyo Corp. - Kawasaki, Japan

Manufacturer:
Not known to have been produced

Witnesses:
none listed

Patent Dates:
Applied: Jul. 10, 2000
Granted: Feb. 18, 2003

Patent Pictures:
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Report data errors or omissions to steward Joel Havens
Description:
Oliff & Berridge, PLC - patent attorneys

Abstract

A micrometer comprising a thimble made, at least in part, of a translucent material, a vernier scale on an inner circumference of the thimble along the circumferential direction and a vernier numeral on an outer circumference of the thimble along the circumferential direction, whereby reading error during measurement can be reduced.

Application filed in Japan, 13 Jul 1999.

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