Home| FAQ Search:Advanced|Person|Company| Type|Class Login
Quick search:
Patent number:
Patent Date:
first    back  next  last
US Patent: 4,255,861
Electrically Digital Display Micrometer
Kiyohiro Nakata - Kure, Japan
Hiroaki Suwa - Kure, Japan

USPTO Classifications:
33/819, 33/820, 377/24, 377/53

Tool Categories:
metalworking tools : machinist tools : measuring tools : micrometers

Kabushiki Kaisha Mitutoyo Seisakusho - Tokyo, Japan

Not known to have been produced

none listed

Patent Dates:
Applied: Jul. 02, 1979
Granted: Mar. 17, 1981

Patent Pictures:
USPTO pdf tiff
Google Patents
Report data errors or omissions
Brisebois & Kruger - patent attorneys


The invention is constituted such that a tubular cavity is formed in the arm of a frame which movably supports the spindle; said cavity houses an index scale and a slit disc; and thereby the measured results can be read as an electric signal without affecting the function of the micrometer, said index scale and said slit disc being located coaxial with the spindle.

Copyright © 2002-2019 - DATAMP