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US Patent: 4,255,861
Electrically Digital Display Micrometer
Patentees:
Kiyohiro Nakata - Kure, Japan
Hiroaki Suwa - Kure, Japan

USPTO Classifications:
33/819, 33/820, 377/24, 377/53

Tool Categories:
metalworking tools : machinist tools : measuring tools : micrometers

Assignees:
Kabushiki Kaisha Mitutoyo Seisakusho - Tokyo, Japan

Manufacturer:
Not known to have been produced

Witnesses:
none listed

Patent Dates:
Applied: Jul. 02, 1979
Granted: Mar. 17, 1981

Patent Pictures:
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Description:
Brisebois & Kruger - patent attorneys

Abstract

The invention is constituted such that a tubular cavity is formed in the arm of a frame which movably supports the spindle; said cavity houses an index scale and a slit disc; and thereby the measured results can be read as an electric signal without affecting the function of the micrometer, said index scale and said slit disc being located coaxial with the spindle.

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