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US Patent: 607,898
Micrometer Gage
Patentee:
Vernon C. Todd - St. Louis, MO

USPTO Classifications:
33/802

Tool Categories:
metalworking tools : machinist tools : measuring tools : thickness gages

Assignees:
Edwin H. Ehrler - St. Louis, MO

Manufacturer:
Not known to have been produced

Witnesses:
G. A. Pennington
Ralph Kalish
Hugh K. Wagner

Patent Dates:
Applied: Oct. 27, 1897
Granted: Jul. 26, 1898

Patent Pictures:
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