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US Patent: 673,307
Micrometer Surface Gage
Patentee:
John Wahlberg - New York, NY

USPTO Classifications:
33/823

Tool Categories:
metalworking tools : machinist tools : measuring tools : thickness gages
metalworking tools : machinist tools : measuring tools : micrometers

Assignees:
None

Manufacturer:
Not known to have been produced

Witnesses:
L. Almquist
C. Sedgwick
Ernest Roch

Patent Dates:
Applied: Sep. 29, 1900
Granted: Apr. 30, 1901

Patent Pictures:
USPTO pdf tiff
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Description:
A. P. Thayer - patent attoney

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