US Patent: 1,415,627 - Optical Scale for Vernier Measurements


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US Patent: 1,415,627

Precision Instrument
Optical Scale for Vernier Measurements

Patentee:

Giovanni Eusebio Giambiasi (exact or similar names) - Philadelphia, PA

USPTO Classifications:

33/791, 356/395, 356/618

Tool Categories:

rules : rule graduations

layout tools : measurement gauges

Assignees:

Howard S Levy - Philadelphia, PA

Lionel F. Levy - Philadelphia, PA

Manufacturer:

Not known to have been produced

Witnesses:

Frederick Diehl

J. C. Ledbetter

Patent Dates:
Applied:	Nov. 07, 1919
Granted:	May 09, 1922

Patent Pictures:

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Report data errors or omissions to steward Ralph Brendler

Description:

This patent shows an improvement to a standard vernier caliper, which uses some optical tricks to allow the precise reading of points between the marks.

The scale is marked with diagonal lines, and fitted with a piece of polarized glass with at the same angle. As the scale is moved, the interference pattern of the two lines wil cause parts of the scale to be obscured. The combination of the vernier measurement and interference pattern will allow the user to accurately estimate the distance from the last vernier line.