Home| FAQ	Search:Advanced|Person|Company| Type|Class	Login

Quick search:	Patent number:	Patent Date:

US Patent: AI289
Measurement of solar altitude
Patentee: Frederick Yeiser (exact or similar names) - Lexington, KY USPTO Classifications: 33/281 Tool Categories: specialty tools : surveying apparatus Assignees: None Manufacturer: Frederick Yeiser - Lexington, KY Sturm, Steffens & Co. - Indianapolis, IN John Hougham - Franklin, IN Witnesses: Unknown	Patent Dates: Granted: Jul. 17, 1860 Patent Pictures: USPTO (New site tip) Google Patents Report data errors or omissions to steward Jeff Joslin
Description: This patent is an additional improvement on patent 22,913. See patent AI247 for an earlier Additional Improvement.

Copyright © 2002-2026 - DATAMP