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US Patent: 661,562
Measuring Gage
Patentee:
Laroy S. Starrett (exact or similar names) - Athol, MA

USPTO Classifications:
285/323, 33/783

Tool Categories:

Assignees:
None

Manufacturer:
Not known to have been produced

Witnesses:
Frank E. Wing
Willard G. Nims

Patent Dates:
Applied: May 19, 1899
Granted: Nov. 13, 1900

Patent Pictures:
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Report data errors or omissions to steward Russ Allen.
Description:
Micrometer type gage for use in dark locations or anywhere use of a conventional micrometer would require the spindle to be moved, changing the measurement.

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