US Patent: 6,519,867 - Measuring Device


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US Patent: 6,519,867

Measuring Device

Patentee:

Akitomo Saeki (exact or similar names) - Kure, Japan

USPTO Classifications:

33/679.1, 33/813, 33/830, 33/831

Tool Categories:

layout tools : measurement gauges

Assignees:

Mitutoyo Corp. - Kawasaki, Japan

Manufacturer:

Not known to have been produced

Witnesses:

none listed

Patent Dates:
Applied:	Jul. 10, 2000
Granted:	Feb. 18, 2003

Patent Pictures:

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Description:

Oliff & Berridge, PLC - patent attorneys

Abstract

A micrometer comprising a thimble made, at least in part, of a translucent material, a vernier scale on an inner circumference of the thimble along the circumferential direction and a vernier numeral on an outer circumference of the thimble along the circumferential direction, whereby reading error during measurement can be reduced.

Application filed in Japan, 13 Jul 1999.