| All Patents in class 250/559.45 |
Patents 1 -
4
of 4
      |
| Number | Date | Patentee | Title | Type |
| 6,252,242 | Jun. 26, 2001 | E. Pekel, I. Laver, L. Singher, G. Toker, J. Shamir, A. Brunfield | High Speed Optical Inspection Apparatus Using Gaussian Distribution Analysis and Method Therefore | |
| 6,255,666 | Jul. 03, 2001 | A. Brunfield, E. Pekel, I. Laver, L. Singher, G. Toker, J. Shamir | High Speed Optical Inspection Apparatus for a Large Transparent Flat Panel Using Gaussian Distribution Analysis and Method Therefor | |
| 6,262,432 | Jul. 17, 2001 | E. Pekel, I. Laver, L. Singher, G. Toker, J. Shamir, A. Brunfield | High Speed Surface Inspection Optical Apparatus for a Reflective Disk Using Gaussian Distribution Analysis and Method Therefor | |
| 6,294,793 | Sep. 25, 2001 | E. Pekel, I. Laver, L. Singher, G. Toker, J. Shamir, A. Brunfield | High Speed Optical Inspection Apparatus for a Transparent Disk Using Gaussian Distribution Analysis and Method Therefor | |
