| All Patents in class 33/504 |
Patents 1 -
9
of 9
      |
| Picture | Number | Date | Patentee | Title |
| | 4,118,871 | Oct. 10, 1978 | E.E. Kirkham | Binary Inspection Probe for Numerically Controlled Machine Tools |
| | 4,750,272 | Jun. 14, 1988 | R.W. Caddell | Tool measuring device employing gap width detection |
| | 4,833,630 | May 23, 1989 | A.M. Honer, D.P. Braman | Method and Apparatus for the Tridimensional Measuring of an Object |
| | 4,866,643 | Sep. 12, 1989 | W. Dutler | Method for Automatic Compensation of Probe Offset in a Coordinate Measuring Machine |
| | 5,066,176 | Nov. 19, 1991 | R. Johnstone | Probe for Machine Tool |
| | 5,778,548 | Jul. 14, 1998 | P. Cerruti | Viewing Device and Method for Three-Dimensional Noncontacting Measurements |
| | 5,883,313 | Mar. 16, 1999 | E. Garau, M. Ercole | Part Measuring Gauge |
| | 6,161,079 | Dec. 12, 2000 | M.K. Schindler, J.H. Zink | Method and Apparatus for Determining Tolerance and Nominal Measurement Values for a Coordinate Measuring Machine |
| | 6,952,883 | Oct. 11, 2005 | C. Zufferey, P. Jordil | Dimension-Measuring Column and Method for Entering a Command to Switch the Measure Mode in Such a Column |
