| All Patents in class 700/195 |
Patents 1 -
8
of 8
      |
| Picture | Number | Date | Patentee | Title |
 | 3,681,582 | Aug. 01, 1972 | N. Keiichi, K. Kimio | Automatic Sizing Device with Linear Scale |
| | 4,118,871 | Oct. 10, 1978 | E.E. Kirkham | Binary Inspection Probe for Numerically Controlled Machine Tools |
| | 4,643,622 | Feb. 17, 1987 | D.A. Winski | Automatic C-Axis Feedrate Control for Machine Tools |
| | 4,724,525 | Feb. 09, 1988 | J.T. Tillson, B.G. Purcell | Real-Time Data Collection Apparatus for Use in Multi-Axis Measuring Machine |
| | 4,833,630 | May 23, 1989 | A.M. Honer, D.P. Braman | Method and Apparatus for the Tridimensional Measuring of an Object |
| | 4,866,643 | Sep. 12, 1989 | W. Dutler | Method for Automatic Compensation of Probe Offset in a Coordinate Measuring Machine |
| | 4,939,678 | Jul. 03, 1990 | W.L. Beckwith, Jr. | Method for Calibration of Coordinate Measuring Machine |
| | 6,161,079 | Dec. 12, 2000 | M.K. Schindler, J.H. Zink | Method and Apparatus for Determining Tolerance and Nominal Measurement Values for a Coordinate Measuring Machine |
