Patents for Adriano Zanier |
Patents 1 -
11
of 11
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Number | Date | Patentee | Title | Type |
EP-579,961 | Aug. 14, 1996 | U. Birkner, A. Bezinge, C. Zufferey, A. Zanier, A. Orita | Measuring Apparatus for Measuring Linear Dimensions | |
5,664,336 | Sep. 09, 1997 | A. Bezinge, A. Zanier | Linear Measuring Device and a Method of Adjusting Said Device | |
EP-719,999 | Feb. 24, 1999 | A. Zanier | Length Measuring Device | |
6,243,965 | Jun. 12, 2001 | L. Borgognon, A. Bovey, A. Zanier | Electronic Micrometer | micrometers |
6,247,244 | Jun. 19, 2001 | M. Paudex, A. Bovey, A. Zanier | Device for Longitudinal Measurement | |
6,745,488 | Jun. 08, 2004 | A. Zanier, P. Jordil | Height-Measuring Column and Method for Regulating a Height-Measuring Column | |
6,751,884 | Jun. 22, 2004 | C. Zufferey, A. Zanier, P. Jordil | Column for Measuring Longitudinal Dimensions | |
6,763,604 | Jul. 20, 2004 | A. Zanier, P. Jordil | Column for Measuring Longitudinal Dimensions | |
EP-1,319,922 | Jan. 24, 2007 | A. Zanier, P. Jordil | Column for Measuring Longitudinal Dimensions | |
EP-1,320,000 | May 23, 2007 | A. Zanier, C. Zufferey, P. Jordil | Method of Calibrating a Measuring Apparatus | |
EP-1,316,778 | Jul. 25, 2007 | A. Zanier, C. Rouge, P. Jordil | Touch Probe and Method of Assembling a Touch Probe | |